c48cb7ebfb
This commit adds unit tests for ADC uclass's methods using sandbox ADC. Testing proper ADC binding: - dm_test_adc_bind() - device binding - dm_test_adc_wrong_channel_selection() - checking wrong channel selection Testing ADC supply operations: - dm_test_adc_supply(): - Vdd/Vss values validating - Vdd regulator updated value validating - Vdd regulator's auto enable state validating Testing ADC operations results: - dm_test_adc_single_channel_conversion() - single channel start/data - dm_test_adc_single_channel_shot() - single channel shot - dm_test_adc_multi_channel_conversion() - multi channel start/data - dm_test_adc_multi_channel_shot() - multi channel single shot Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com> Cc: Simon Glass <sjg@chromium.org> Signed-off-by: Minkyu Kang <mk7.kang@samsung.com> |
||
|---|---|---|
| .. | ||
| dfu | ||
| dm | ||
| env | ||
| fs | ||
| image | ||
| stdint | ||
| trace | ||
| ums | ||
| vboot | ||
| Kconfig | ||
| Makefile | ||
| cmd_repeat.sh | ||
| cmd_ut.c | ||
| command_ut.c | ||
| common.sh | ||
| compression.c | ||
| time_ut.c | ||
| ut.c | ||